US Patent Issued to SAMSUNG DISPLAY on Oct. 28 for "Substrate inspecting apparatus for obtaining synthetic image data and method of inspecting substrate by obtaining synthetic image data" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,203, issued on Oct. 28, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).

"Substrate inspecting apparatus for obtaining synthetic image data and method of inspecting substrate by obtaining synthetic image data" was invented by Myoungchul Kim (Yongin-si, South Korea), Eonpil Shin (Yongin-si, South Korea), Donghoon Lee (Yongin-si, South Korea), Taejun Kim (Yongin-si, South Korea), Jihoon Seo (Yongin-si, South Korea), Moonkyoung Yong (Yongin-si, South Korea) and Jiyong Jung (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A substrate inspection apparatus includes: an image sensor which obtains first image data o...