ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,251, issued on Oct. 21, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).
"Method of measuring thickness of display device" was invented by Sang Heon Ye (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of measuring a thickness of a display device according to an embodiment includes: acquiring a sensing value by scanning external light to a photo sensing pixel of the display device; and measuring an organic layer thickness at a tag part of the display device and comparing the measured thickness with the sensing value."
The patent was filed on June 19, 2023, under Application No. 18/211,456.
*For fur...