ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,451,037, issued on Oct. 21, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).
"Method of inspecting a pixel" was invented by Pongok Park (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of inspecting a pixel includes measuring a first drain current by applying a first gate voltage with a first voltage interval to a gate terminal of a transistor included in a test pattern in a first voltage period, generating a first gate voltage-drain current graph based on the first drain current, measuring a second drain current by applying a second gate voltage which is lower than the first gate voltage with a second ...