ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,607, issued on May 20, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"System and method for generating machine learning model with trace data" was invented by Janghwan Lee (Pleasanton, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condit...