US Patent Issued to SAMSUNG DISPLAY on May 13 for "Multi-view luminance measuring device and method for measuring multi-view luminance" (South Korean Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,185, issued on May 13, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea).

"Multi-view luminance measuring device and method for measuring multi-view luminance" was invented by Young Min Park (Yongin-si, South Korea), O Jun Kwon (Yongin-si, South Korea), Jae Joong Kwon (Yongin-si, South Korea), Jin Seo (Yongin-si, South Korea), A Ree Song (Yongin-si, South Korea), Eun Jung Lee (Yongin-si, South Korea), Ha Young Lee (Yongin-si, South Korea) and Young Sang Ha (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multi-view luminance measuring device includes: a base substrate having a long side extending in a first di...