ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,256, issued on May 13, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea).
"Inspection method and inspection apparatus for performing the same" was invented by Alexander Voronov (Suwon-si, South Korea), Jooseob Ahn (Hwaseong-si, South Korea), Hyeonsuk Guak (Suwon-si, South Korea), Kihun Kim (Cheonan-si, South Korea), Jekil Ryu (Suwon-si, South Korea) and Hyeongmin Ahn (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection method includes irradiating a laser to an inspection target, reflecting a first emitted laser from a transmission layer included in the inspection target, reflecting a second emitted las...