ALEXANDRIA, Va., March 5 -- United States Patent no. 12,243,457, issued on March 4, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea).
"Apparatus and method for defect inspection of display panel" was invented by Min-Hong Kim (Gyeonggi-do, South Korea), Taejoon Kim (Seongnam-si, South Korea), Jungmok Park (Hwaseong-si, South Korea), Bogeun Yuk (Hwaseong-si, South Korea) and Hyun-Wook Cho (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an apparatus for inspecting a defect of a display panel. The apparatus for inspecting includes the display panel that displays an image, an input sensor that is disposed on the display panel and senses an input applied from ou...