ALEXANDRIA, Va., June 25 -- United States Patent no. 12,340,718, issued on June 24, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).
"Electronic device testing method" was invented by Jinwoo Park (Yongin-si, South Korea), Bogeun Yuk (Yongin-si, South Korea), Taejoon Kim (Yongin-si, South Korea), Seungrok Lee (Yongin-si, South Korea) and Il Ho Lee (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device testing method includes providing an electronic device including a display layer including a common electrode and a sensor layer that is disposed on the display layer and that includes a plurality of first electrodes and a plurality of second electrodes th...