ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,235,220, issued on Feb. 25, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea).
"Method of determining abnormality of display manufacturing facility" was invented by Jinwook Lee (Yongin-si, South Korea), Changyun Moon (Yongin-si, South Korea) and Hyunjoon Kim (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining whether a display manufacturing facility is abnormal includes a first step of obtaining facility information data of facilities used to manufacture a display panel, a second step of preparing a display module by attaching a printed circuit board and a driving chip to the display panel, a th...