ALEXANDRIA, Va., Feb. 12 -- United States Patent no. 12,222,294, issued on Feb. 11, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Optical inspection device and inspecting method using the same" was invented by Jeong Moon Lee (Seoul, South Korea), Dae Hong Kim (Seongnam-si, South Korea) and Hyung Jin Lee (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An optical inspection device includes: a barrel; a first light source unit at a first side of the barrel and configured to irradiate light of a first wavelength range through a first light path; a second light source unit at a second side of the barrel, the second side being different from the first side, and configure...