ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,997, issued on Dec. 9, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).
"Inspection apparatus and method" was invented by Tae-Jin Hwang (Yongin-si, South Korea), Se-Kwang Han (Yongin-si, South Korea), Jaemin Son (Yongin-si, South Korea) and Seonghyeon Cheon (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are inspection apparatuses and methods. The inspection apparatus includes a light source configured to irradiate a beam to an inspection object including a first part and a second part different from the first part; an inspection module spaced apart from the inspection object and onto which a beam,...