ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,316, issued on Dec. 16, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Optical inspection apparatus" was invented by Je Won Yoo (Bucheon-si, South Korea), Basrur Veidhes (Yongin-si, South Korea), Dae Hyun Kim (Hwaseong-si, South Korea), Hyun Min Cho (Seoul, South Korea), Jong Won Lee (Hwaseong-si, South Korea) and Joo Yeol Lee (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An optical inspection apparatus includes a stage that supports a target substrate, the target substrate including a plurality of light emitting elements, a jig that applies an electrical signal to the target substrate, the jig including...