US Patent Issued to SAFRAN/Association pour la Recherche et le, Developpement des Methodes et Processus Industriels on Aug. 5 for "Device and method for measuring angles of orientation of an x-ray imaging system" (French Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,337, issued on Aug. 5, was assigned to SAFRAN/Association pour la Recherche et le (Paris) and Developpement des Methodes et Processus Industriels (Paris).

"Device and method for measuring angles of orientation of an x-ray imaging system" was invented by Edward Romero (Moissy-Cramayel, France), Alexiane Arnaud (Moissy-Cramayel, France), Clement Remacha (Moissy-Cramayel, France) and Henry Proudhon (Moissy-Cramayel, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device and method for measuring angles of orientation of an x-ray imaging system including an x-ray source, an x-ray detector and a sample holder arranged to receive a sample to be anal...