US Patent Issued to S.D. Sight Diagnostics on Aug. 12 for "System and method for calculating focus variation for a digital microscope" (Israeli Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,328, issued on Aug. 12, was assigned to S.D. Sight Diagnostics Ltd. (Tel Aviv, Israel).

"System and method for calculating focus variation for a digital microscope" was invented by Noam Yorav-Raphael (Jerusalem), Uri Wolfovitz (Haifa, Israel) and Joseph Joel Pollak (Neve Daniel, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus and methods are described for use with a digital microscope unit that includes a digital microscope. A biological cell sample that is disposed within a sample carrier is received into the digital microscope unit. It is determined that there is a variation in the focal depth of the biological sample with respect ...