US Patent Issued to S.D. DIAGNOSTICS on Sept. 30 for "Method and system for imaging a cell sample" (Israeli, American Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,765, issued on Sept. 30, was assigned to S.D. DIAGNOSTICS LTD. (Tel Aviv, Israel).

"Method and system for imaging a cell sample" was invented by Yuval Greenfield (Sunnyvale, Calif.), Yonatan Bilu (Jerusalem), Joseph Joel Pollak (Neve Daniel, Israel) and Noam Yorav-Raphael (Tekoa, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus and methods are described for use with a cell sample that includes a plurality of cells. A series of images associated with a series of depth levels of the cell sample are acquired, by performing a depth scan of cell sample with a microscope. One of the depth levels is identified as being an optimum focal plan...