ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,418, issued on Sept. 9, was assigned to RUCKUS SPACE LLC (Portland, Ore.).
"Freeform metrology information acquisition system" was invented by Shawn Small (Portland, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A freeform metrology information acquisition system is disclosed. The system includes a measurement probe, one or more cameras, and a computing device. The measurement probe is configured to obtain metrology information for an object under inspection. The camera(s) are configured to image a scene including the measurement probe and the object under inspection. The computing device is configured to receive the metrology information fro...