US Patent Issued to RTX on Oct. 7 for "Optical in-situ inspection system" (Connecticut Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,435,642, issued on Oct. 7, was assigned to RTX Corp. (Farmington, Conn.).

"Optical in-situ inspection system" was invented by Jeremiah C. Lee (Coventry, Conn.), David L. Lincoln (Cromwell, Conn.), Scott Goyette (Moosup, Conn.), Zaffir A. Chaudhry (Portland, Conn.) and Danbing Seto (Avon, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An in-situ system for a gas turbine engine blade inspection including a sensor system configured to capture images of a forward surface of at least one gas turbine engine blade; a processor coupled to the sensor system, the processor configured to determine damage to the at least one gas turbine engine blade based on v...