US Patent Issued to RTX on Oct. 28 for "Measurement system having a capacitance probe and an optical probe" (Connecticut Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,213, issued on Oct. 28, was assigned to RTX Corp. (Farmington, Conn.).

"Measurement system having a capacitance probe and an optical probe" was invented by Eli Warren (Wethersfield, Conn.) and Bryan J. Hackett (Berlin, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement system is provided that includes a probe assembly. The probe assembly includes a capacitance probe and an optical probe. The capacitance probe includes a capacitance sensor that forms a sensor face of the probe assembly. An aperture projects axially through the capacitance sensor to the sensor face. The optical probe is configured with an optical line of sight through ...