US Patent Issued to RTX on Dec. 30 for "Image analysis method for multi-phase system with overlapping grayscale intensities" (California Inventor)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,770, issued on Dec. 30, was assigned to RTX Corp. (Farmington, Conn.).

"Image analysis method for multi-phase system with overlapping grayscale intensities" was invented by Evan B. Callaway (Santa Barbara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining coating thicknesses of a coated fiber embedded in a matrix is presented. A scanning electron microscope (SEM) image is captured of a composite material having multiple coated fibers embedded in a matrix. This image depicts a cross-sectional portion of the composite material. A processor identifies a region of the image depicting a cross-section of one among the pluralit...