US Patent Issued to Roku on July 1 for "Product metrics monitoring and anomaly detection using machine learning models" (California, Massachusetts Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,348,793, issued on July 1, was assigned to Roku Inc. (San Jose, Calif.).

"Product metrics monitoring and anomaly detection using machine learning models" was invented by Suvrath V. Penmetcha (Mountain View, Calif.), Le Zhang (San Jose, Calif.), Vijay Anand Raghavan (Newton, Mass.), Beth Teresa Logan (Cambridge, Mass.), Kevin Henely (San Francisco), Sahib Bal (San Jose, Calif.) and Sayan Maity (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method may include determining a combination of values of attributes represented by reference data associated with computing devices by training a machine learning model based on an association betw...