US Patent Issued to ROKU on Feb. 10 for "In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT)" (Texas Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,915, issued on Feb. 10, was assigned to ROKU INC. (San Jose, Calif.).

"In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT)" was invented by Nermin Osmanovic (Austin, Texas) and Deepak Chand Jangid (Cedar Park, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments described herein generally relate to analyzing a signal generated by a device under test (DUT). In particular, the signal generated by the DUT may be compared to a reference signal to determine pass/fail results for the DUT. For example, a method may include: storing, on a computing device, a reference signal from a reference device; re...