US Patent Issued to Rohde & Schwarz on Sept. 9 for "Measurement device for characterizing a device-under-test" (German Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,166, issued on Sept. 9, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Measurement device for characterizing a device-under-test" was invented by Thorsten Lueck (Neuried, Germany) and Jan-Patrick Schultheis (Kirchheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a measurement device for characterizing a device-under-test, DUT. The device includes an RF signal generator to generate test signals in parallel. The test signals each have a different frequency. A signal path connects the RF signal generator to a port of the measurement device. The port is connected to the DUT. The signal path feeds t...