US Patent Issued to Rohde & Schwarz on Oct. 28 for "Method and device for detecting and localizing faults in an antenna array, and test system" (German Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,047, issued on Oct. 28, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Method and device for detecting and localizing faults in an antenna array, and test system" was invented by Marwa Sai (Munich), Andrew Schaefer (Oberhaching, Germany), Benoit Derat (Munich) and Adam Tankielun (Ottobrunn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method for detecting and localizing faults in an antenna array comprises performing fault detection on the antenna array to identify the presence of at least one faulty antenna element of the antenna array. The fault detection is performed using a machine learning technique. I...