ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,451,976, issued on Oct. 21, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).
"Method and apparatus for an accurate determination of a transfer function of a device under test" was invented by Andreas Lagler (Rosenheim, Germany), Florian Ramian (Karlsfeld, Germany) and Florian Gerbl (Olching, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus and a method for accurate determination of a transfer function of a device under test (DUT) comprising a measurement unit adapted to measure a transfer function of the device under test (DUT) across a frequency range in response to a wideband signal applied by the measurement unit to the devi...