US Patent Issued to Rohde & Schwarz on Nov. 11 for "Method of determining a setting for performing a spurious emission measurement and method of performing a spurious emission measurement" (German Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,961, issued on Nov. 11, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Method of determining a setting for performing a spurious emission measurement and method of performing a spurious emission measurement" was invented by Benjamin Haehlke (Munich), Pascal Wolff (Munich), Vincent Abadie (Munich) and Ralf Zoll (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method of determining a setting for performing a spurious emission measurement of a device under test. A preliminary total radiated power (TRP) measurement of a wanted signal of the device under test is performed along a three-dimensional measure...