US Patent Issued to Rohde & Schwarz on May 27 for "Power sensor arrangement for on-wafer power calibration" (German Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,719, issued on May 27, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Power sensor arrangement for on-wafer power calibration" was invented by Christopher Stumpf (Munich) and Daniel Mueller-Remer (Guenzburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a power sensor arrangement for on-wafer power calibration including a power sensor(s). The power sensor(s) include: a first connection surface which is arranged to receive a probe tip of a probing device; a power measurement cell which is electrically connected to the first connection surface, wherein the power measurement cell is configured to mea...