US Patent Issued to Rohde & Schwarz on March 18 for "Use of configurable phase range to detect DDR read and write bursts" (Singaporean Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,935, issued on March 18, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Use of configurable phase range to detect DDR read and write bursts" was invented by Kevin Guo (Singapore) and Hong Jin Kim (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method (and corresponding system, computer program and storage device) for testing a device under test, DUT, comprising: generating or receiving, by a component of the DUT, a bus signal, wherein the bus signal comprises a first data signal having a plurality of first phase angles or a second data signal having a plurality of second phase angles; averaging the phase angles for a predeterm...