ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,808, issued on Feb. 10, was assigned to ROHDE & SCHWARZ GMBH & Co. KG (Munich).
"Test system and test method" was invented by Reiner Stuhlfauth (Landau, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a test system for testing a device under test, the test system comprising at least one measurement application antenna, and a Reconfigurable Intelligent Surface, RIS, reflector configured to reflect an incoming signal that impinges on the RIS reflector with a predefined impinging angle as reflected signal with a predefined outgoing angle, and a measurement application device coupled to the measurement application ...