US Patent Issued to Rohde & Schwarz on Dec. 30 for "Testing system and method for testing devices under test" (Texas Inventor)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,577, issued on Dec. 30, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Testing system and method for testing devices under test" was invented by Samuel Reiter (Dallas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing system for testing a device under test comprises a test chamber with a test location for receiving the device under test. The testing system further comprises at least one first antenna with a corresponding reflector. The at least one first antenna is configured to transmit and/or receive an electromagnetic signal along an indirect beam path. The indirect beam path extends between said at least one first antenna and the...