ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,407, issued on Aug. 5, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).
"System and method for testing a device under test" was invented by Hendrik Bartko (Unterhaching, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system for testing a device under test, DUT, comprises a holder configured to hold the DUT, wherein the DUT comprises at least one reconfigurable intelligent surface, RIS. A first antenna array generates plane waves at a position of the at least one RIS when the DUT is arranged on the holder. The first antenna array can generate plane waves having different angles of incidence at the position of the at least one RIS. A s...