US Patent Issued to Rockley Photonics on July 15 for "Method of testing, wafer, and testing station" (Irish Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,151, issued on July 15, was assigned to Rockley Photonics Ltd. (Altrincham, Great Britain).

"Method of testing, wafer, and testing station" was invented by Mohamad Dernaika (Cork, Ireland), Ludovic Caro (Cork, Ireland), Alison Perrott (Cork, Ireland), Hua Yang (Cork, Ireland) and Frank Peters (Cork, Ireland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing one or more optoelectronic devices located on respective device coupons. The device coupon(s) are present on a wafer. The method comprises: testing the or each optoelectronic device using a corresponding testing element, the testing element(s) being located on the same wafer as th...