ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,915, issued on Dec. 23, was assigned to ROCHE DIAGNOSTICS OPERATIONS INC. (Indianapolis).
"Processing of images containing overlapping particles" was invented by Nils Bruenggel (Muri, Switzerland), Patrick Conway (Cham, Switzerland) and Pascal Vallotton (Buchs, Switzerland).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method of generating training data to be used to train a machine learning model for generating a segmentation mask of an image containing overlapping particles. Training data is generated from sparse particle images which contain no overlaps. Generating masks for non-overlapping particles is generally not a prob...