ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,470, issued on Oct. 21, was assigned to ROBERT BOSCH GMBH (Stuttgart, Germany).
"Apparatus and method for monitoring a semiconductor component" was invented by Daniel Monteiro Diniz Reis (Esslingen am Neckar, Germany), Frank Schatz (Kornwestheim, Germany), Mathias Mews (Reutlingen, Germany) and Timo Schary (Aichtal-Neuenhaus, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus and a method for monitoring a semiconductor component are disclosed. A leakage current which flows through a first electrode and a second electrode of the semiconductor component is detected during operation of the semiconductor component. During a comparison, ...