US Patent Issued to RIKEN on Oct. 21 for "Raman scattering spectrometric apparatus and Raman scattering spectroscopic method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,365, issued on Oct. 21, was assigned to RIKEN (Wako, Japan).

"Raman scattering spectrometric apparatus and Raman scattering spectroscopic method" was invented by Koji Sugioka (Wako, Japan) and Shi Bai (Wako, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The Raman scattering spectroscopic method according to the present invention include: preparing a chip having a channel in which a nanostructure is formed; introducing an analyte solution into a part of the channel in the chip; irradiating an interface of the analyte solution with a laser beam; and measuring Raman scattering light induced by the irradiation of the laser beam. The measurement m...