ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,007, issued on Nov. 4, was assigned to RIKEN (Saitama, Japan).
"Electron microscope analysis system" was invented by Daisuke Shindo (Wako, Japan) and Takeshi Tomita (Wako, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electron microscope analysis system includes a detector that captures an electron microscope image formed on a detection plane by an electron beam that irradiates a specimen to be observed and transmits through the specimen. Electrons each having a de Broglie wave motion are integrated to be a linear rotor that is a collection of the electrons each having the de Broglie wave motion, so that each electron can be recognized, the...