US Patent Issued to RIKEN on March 25 for "Nondestructive inspecting device, and nondestructive inspecting method" (Japanese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,340, issued on March 25, was assigned to RIKEN (Wako, Japan).

"Nondestructive inspecting device, and nondestructive inspecting method" was invented by Kunihiro Fujita (Wako, Japan), Chihiro Iwamoto (Wako, Japan), Takaoki Takanashi (Wako, Japan) and Yoshie Otake (Wako, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A nondestructive inspecting device (10) includes a neutron emission device (2) that emits a neutron beam to a local irradiation location on a surface (la) of an inspection target (1), a detection device (3) that detects, at each of inspection positions facing the surface (la), scattered neutrons returned from the inspection target (...