US Patent Issued to Riken on Jan. 13 for "Method and kit for detecting target nucleic acid fragment" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,522,859, issued on Jan. 13, was assigned to Riken (Wako, Japan).

"Method and kit for detecting target nucleic acid fragment" was invented by Rikiya Watanabe (Wako, Japan), Osamu Nureki (Tokyo) and Hiroshi Nishimasu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a target nucleic acid fragment in a sample, the method including a step of bringing the sample into contact with a gRNA, a Cas protein, and a substrate nucleic acid fragment, in which the Cas protein expresses nuclease activity after forming a complex with the gRNA and the target nucleic acid fragment, the substrate nucleic acid fragment is labeled with a fluorescent...