US Patent Issued to RIGAKU on Sept. 2 for "Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,235, issued on Sept. 2, was assigned to RIGAKU Corp. (Tokyo).

"Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium" was invented by Hideo Toraya (Akishima, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a degree-of-crystallinity measurement apparatus including: an X-ray scattering pattern acquisition module which acquires an X-ray scattering pattern of a sample including a crystalline portion and an amorphous portion of a target substance; a pattern decomposition module which acquires a diffraction pattern of the crystalline portion and a continuous pattern from ...