ALEXANDRIA, Va., March 12 -- United States Patent no. 12,247,935, issued on March 11, was assigned to RIGAKU Corp. (Tokyo).
"X-ray fluorescence spectrometer" was invented by Yasuhiko Nagoshi (Takatsuki, Japan), Toshiaki Kozuki (Takatsuki, Japan) and Yuki Fujimoto (Takatsuki, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray fluorescence spectrometer includes: a vacuum chamber (17) configured to be evacuated including at least a detection chamber in which a detector is disposed; drive units (18A to 18H) each including a drive source outside the vacuum chamber (17), and configured to perform a mechanical operation in the vacuum chamber (17); and a vacuum leakage location identification unit (23A, 2...