US Patent Issued to RIGAKU on Jan. 13 for "Peak identification analysis program, and X-ray fluorescent spectrometer" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,624, issued on Jan. 13, was assigned to RIGAKU Corp. (Tokyo).

"Peak identification analysis program, and X-ray fluorescent spectrometer" was invented by Wataru Matsuda (Takatsuki, Japan) and Yoshiyuki Kataoka (Takatsuki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "To enable identification analysis of a fluorescent X-ray spectrum and verification of an analysis result to be easily performed, provided is a storage medium for storing a peak identification analysis program for causing a computer used for an X-ray fluorescence spectrometer. The program causes the computer to execute: a first list display step of displaying a list of elements and...