ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,195, issued on Dec. 2, was assigned to RIGAKU Corp. (Tokyo).
"Detector stand X-ray diffraction apparatus" was invented by Yuji Shiramata (Tokyo) and Atsushi Kuji (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A detector stand for an X-ray detector is provided. A first arrangement portion arranges the X-ray detector in first orientation. A second arrangement portion arranges the X-ray detector in second orientation. The X-ray detector can be fixed to a mounting portion. In the detector stand, the X-ray detector is selectively mountable on the first arrangement portion or the second arrangement portion through the mounting portion. An arrangemen...