ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,666, issued on Aug. 19, was assigned to RIGAKU Corp. (Tokyo).
"Thermal analysis apparatus and control software for thermal analysis apparatus" was invented by Koichiro Noritake (Tokyo) and Yoshinobu Hosoi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A thermal analysis apparatus includes circuitry for displaying a graph of the thermal analysis data relating to temperature or time on a display displaying a sample image on the display, generating color information data of range and type selected from the sample image, displaying a graph of the color information data relating to temperature or time side by side with the graph of the thermal ana...