ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,860, issued on Aug. 12, was assigned to RIGAKU Corp. (Tokyo).
"X-ray fluorescence spectrometer" was invented by Hiroyuki Kawakami (Takatsuki, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an X-ray fluorescence spectrometer that achieves a uniform state on a back side of a thin sheet-shaped sample so as to prevent a difference in a measurement condition depending on a measurement position. The X-ray fluorescence spectrometer includes: a sample stage a background correction cover, which is arranged adjacent to an outer side of the sample stage so that a surface of the background correction cover is substantially flush with a surface...