US Patent Issued to RIGAKU on April 29 for "Correction amount specifying apparatus, method, program, and jig" (Japanese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,301, issued on April 29, was assigned to RIGAKU Corp. (Tokyo).

"Correction amount specifying apparatus, method, program, and jig" was invented by Takuya Kikuchi (Tokyo), Tetsuya Ozawa (Tokyo) and Ryuji Matsuo (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A correction amount specifying apparatus comprises circuitry for storing diffraction data including a combination of the diffraction angle of the irradiation X-rays with respect to the sample rotation angle and the sample surface height, the diffraction data being acquired by irradiating X-rays to a standard sample that is an aggregate of isotropic and stress free crystal particles, determini...