US Patent Issued to RIGAKU, CHUBU ELECTRIC POWER on Aug. 26 for "Damage measurement method, apparatus and program, and x-ray diffraction apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,141, issued on Aug. 26, was assigned to RIGAKU Corp. (Tokyo) and CHUBU ELECTRIC POWER COMPANY Inc. (Aichi, Japan).

"Damage measurement method, apparatus and program, and x-ray diffraction apparatus" was invented by Ryouichi Yokoyama (Tokyo), Kazuhiko Omote (Tokyo) and Daisuke Kobayashi (Aichi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A damage measurement technique capable of measuring damage of a sample in a single crystal state, regardless of the surrounding condition, includes irradiating microbeam white X-rays to a sample in a single crystal state, diffraction of a spot generated by the irradiation is detected, a coefficient on varian...