US Patent Issued to RESONAC on March 11 for "Surface analysis method, surface analysis system, and surface analysis program" (Japanese Inventor)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,247,999, issued on March 11, was assigned to RESONAC Corp. (Tokyo).

"Surface analysis method, surface analysis system, and surface analysis program" was invented by Yuki Arai (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A surface analysis method according to an embodiment includes: acquiring a force curve corresponding to measurement of a sample surface by a scanning probe microscope; calculating a physical quantity of an organic material forming the sample surface based on the force curve, for each of an observation point group; and outputting analysis data indicating the physical quantity of each of the observation point group. The acquiring...