US Patent Issued to Research & Business Foundation SUNGKYUNKWAN UNIVERSITY on Dec. 9 for "Method and apparatus for extracting noise defect, and storage medium storing instructions to perform method for extracting noise defect" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,802, issued on Dec. 9, was assigned to Research & Business Foundation SUNGKYUNKWAN UNIVERSITY (Suwon-si, South Korea).

"Method and apparatus for extracting noise defect, and storage medium storing instructions to perform method for extracting noise defect" was invented by Jong Seok Lee (Suwon-si, South Korea), Tae Heung Kim (Suwon-si, South Korea) and Minseok Han (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a method of extracting a noise defect from defect data. The method comprises obtaining the defect data including data on a plurality of defects, determining one of a plurality of abnormal value calculator...