US Patent Issued to Rensselaer Polytechnic Institute on Oct. 28 for "Polarimetric coherent diffraction imaging" (New York Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,236, issued on Oct. 28, was assigned to Rensselaer Polytechnic Institute (Troy, N.Y.).

"Polarimetric coherent diffraction imaging" was invented by Edwin Fohtung (Niskayuna, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, there is provided method of imaging a biological sample. The method includes providing, by a polarizing source assembly, a source polarized coherent electromagnetic beam to the biological sample. The method further includes capturing, by a detector assembly, an intermediate electromagnetic beam from the biological sample. The intermediate electromagnetic beam is related to the source polarized coherent electro...