US Patent Issued to RENESAS ELECTRONICS on Sept. 2 for "Fault prediction device and fault prediction method" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,604, issued on Sept. 2, was assigned to RENESAS ELECTRONICS Corp. (Tokyo).

"Fault prediction device and fault prediction method" was invented by Toshiyuki Syo (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A fault prediction device capable of predicting an accurate deterioration state is provided. A fault prediction device for predicting fault of a target device whose deterioration state transitions with elapse of time includes autoencoders AED1 to AED4 respectively corresponding to deterioration states of the target device. The autoencoder AED2 corresponding to a first deterioration state determines whether the target device exists in the fi...