US Patent Issued to RENESAS ELECTRONICS on Oct. 28 for "Abnormality detection apparatus, abnormality detection system, and abnormality detection method" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,946, issued on Oct. 28, was assigned to RENESAS ELECTRONICS Corp. (Tokyo).

"Abnormality detection apparatus, abnormality detection system, and abnormality detection method" was invented by Kei Hagiwara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The abnormality detection device includes a first extraction unit extracting an input waveform data from a waveform data input to the first extraction unit, a first determination unit for determining whether the input waveform data includes a detection object waveform data, a second extraction unit for extracting and outputting the detection object waveform data from the input waveform data when th...